| Title | Self-Adjusting Constrained Random Stimulus Generation Using Splitting Evenness Evaluation and XOR Constraints |
| Author | Shujun Deng, Zhiqiu Kong, *Jinian Bian, Yanni Zhao (Tsinghua Univ., China) |
| Page | pp. 769 - 774 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Diagnosing Integrator Leakage of Single-Bit First-Order Delta-Sigma Modulator Using DC Input |
| Author | *Xuan-Lun Huang, Chen-Yuan Yang, Jiun-Lang Huang (National Taiwan Univ., Taiwan) |
| Page | pp. 775 - 780 |
| Detailed information (abstract, keywords, etc) | |
| Title | Path Selection for Monitoring Unexpected Systematic Timing Effects |
| Author | *Nicholas Callegari, Pouria Bastani, Li-C. Wang (Univ. of California, Santa Barbara, United States), Sreejit Chakravarty, Alexander Tetelbaum (LSI Corp., United States) |
| Page | pp. 781 - 786 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Design for Burn-In Test: A Technique for Burn-In Thermal Stability under Die-to-Die Parameter Variations |
| Author | Mesut Meterelliyoz, *Kaushik Roy (Purdue Univ., United States) |
| Page | pp. 787 - 792 |
| Detailed information (abstract, keywords, etc) | |
| Title | Test Infrastructure Design for Core-Based System-on-Chip Under Cycle-Accurate Thermal Constraints |
| Author | *Thomas Edison Yu, Tomokazu Yoneda (NAIST, Japan), Krishnendu Chakrabarty (Duke Univ., United States), Hideo Fujiwara (NAIST, Japan) |
| Page | pp. 793 - 798 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |