| Title | (Panel Discussion) Dependable VLSI: Device, Design and Architecture -- How should they cooperate ? -- |
| Author | Organizer: Shuichi Sakai (University of Tokyo, Japan), Panelists: Hidetoshi Onodera (Kyoto University, Japan), Hiroto Yasuura (Kyushu University, Japan), James C. Hoe (Carnegie Mellon University, United States) |
| Page | pp. 859 - 860 |
| Keyword | VLSI, dependability, device, design, architecture |
| Abstract | VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture. |