Title | An Intelligent Analysis of Iddq Data for Chip Classification in Very Deep-Submicron (VDSM) CMOS Technology |
Author | Chia-Ling Chang, Chia-Ching Chang, Hui-Ling Chan, *Charles H.-P. Wen (National Chiao Tung Univ., Taiwan), Jayanta Bhadra (Freescale Semiconductor Inc., U.S.A.) |
Page | pp. 163 - 168 |
Detailed information (abstract, keywords, etc) |
Title | CODA: A Concurrent Online Delay Measurement Architecture for Critical Paths |
Author | Yubin Zhang (Chinese Academy of Sciences, China), Haile Yu, *Qiang Xu (Chinese Univ. of Hong Kong, Hong Kong) |
Page | pp. 169 - 174 |
Detailed information (abstract, keywords, etc) |
Title | Low-cost Control Flow Error Protection by Exploiting Available Redundancies in the Pipeline |
Author | Mohammad Abdur Rouf, *Soontae Kim (KAIST, Republic of Korea) |
Page | pp. 175 - 180 |
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Title | Detection and Diagnosis of Faulty Quantum Circuits |
Author | *Alexandru Paler, Ilia Polian (Univ. of Passau, Germany), John P. Hayes (Univ. of Michigan, U.S.A.) |
Page | pp. 181 - 186 |
Detailed information (abstract, keywords, etc) |