Title | EPIC: Efficient Prediction of IC Manufacturing Hotspots With A Unified Meta-Classification Formulation |
Author | Duo Ding, Bei Yu, Joydeep Ghosh, *David Z. Pan (Univ. of Texas, Austin, U.S.A.) |
Page | pp. 263 - 270 |
Detailed information (abstract, keywords, etc) |
Title | GNOMO: Greater-than-NOMinal Vdd Operation for BTI Mitigation |
Author | *Saket Gupta, Sachin Sapatnekar (Univ. of Minnesota, U.S.A.) |
Page | pp. 271 - 276 |
Detailed information (abstract, keywords, etc) |
Title | Tier-Adaptive-Voltage-Scaling (TAVS): A Methodology for Post-Silicon Tuning of 3D ICs |
Author | Kwanyeob Chae, *Saibal Mukhopadhyay (Georgia Tech, U.S.A.) |
Page | pp. 277 - 282 |
Detailed information (abstract, keywords, etc) |
Title | Body Bias Clustering for Low Test-Cost Post-Silicon Tuning |
Author | Shuta Kimura, *Masanori Hashimoto, Takao Onoye (Osaka Univ., Japan) |
Page | pp. 283 - 289 |
Detailed information (abstract, keywords, etc) |