Title | (Invited Paper) Robust and Resilient Designs from the Bottom-Up: Technology, CAD, Circuit, and System Issues |
Author | Vijay J. Reddi, David Z. Pan (Univ. of Texas, Austin, U.S.A.), Sani Nassif (IBM, U.S.A.), Keith A. Bowman (Intel, U.S.A.) |
Page | pp. 7 - 16 |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Technology Challenges beyond 22nm |
Author | *Sani Nassif (IBM, U.S.A.) |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Physical CAD for Robust Designs |
Author | *David Z. Pan (Univ. of Texas, Austin, U.S.A.) |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Resilient Circuit Design Trade-Offs for Improving Performance & Energy Efficiency |
Author | *Keith A. Bowman (Intel, U.S.A.) |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Coordinated System Design for Resiliency |
Author | *Vijay J. Reddi (Univ. of Texas, Austin, U.S.A.) |
Detailed information (abstract, keywords, etc) |