Title | Statistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations |
Author | *Farshad Firouzi, Saman Kiamehr, Mehdi B. Tahoori (Karlsruhe Inst. of Tech., Germany) |
Page | pp. 594 - 600 |
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Title | CLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis |
Author | *Mojtaba Ebrahimi, Liang Chen (Karlsruhe Inst. of Tech., Germany), Hossein Asadi (Sharif Univ. of Tech., Iran), Mehdi B. Tahoori (Karlsruhe Inst. of Tech., Germany) |
Page | pp. 601 - 607 |
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Title | Application Specified Soft Error Failure Rate Analysis using Sequential Equivalence Checking Techniques |
Author | *Tun Li, Dan Zhu, Sikun Li, Yang Guo (National Univ. of Defense Tech., China) |
Page | pp. 608 - 613 |
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Title | An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation |
Author | *Michihiro Shintani, Takashi Sato (Kyoto Univ., Japan) |
Page | pp. 614 - 619 |
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