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The 18th Asia and South Pacific Design Automation Conference

Session 7C  Reliability Analysis and Test
Time: 10:20 - 12:20 Friday, January 25, 2013
Chairs: David Z. Pan (Univ. of Texas, Austin, U.S.A.), Alex Orailoglu (Univ. of California, San Diego, U.S.A.)

7C-1 (Time: 10:20 - 10:50)
TitleStatistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations
Author*Farshad Firouzi, Saman Kiamehr, Mehdi B. Tahoori (Karlsruhe Inst. of Tech., Germany)
Pagepp. 594 - 600
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7C-2 (Time: 10:50 - 11:20)
TitleCLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis
Author*Mojtaba Ebrahimi, Liang Chen (Karlsruhe Inst. of Tech., Germany), Hossein Asadi (Sharif Univ. of Tech., Iran), Mehdi B. Tahoori (Karlsruhe Inst. of Tech., Germany)
Pagepp. 601 - 607
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7C-3 (Time: 11:20 - 11:50)
TitleApplication Specified Soft Error Failure Rate Analysis using Sequential Equivalence Checking Techniques
Author*Tun Li, Dan Zhu, Sikun Li, Yang Guo (National Univ. of Defense Tech., China)
Pagepp. 608 - 613
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7C-4 (Time: 11:50 - 12:20)
TitleAn Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation
Author*Michihiro Shintani, Takashi Sato (Kyoto Univ., Japan)
Pagepp. 614 - 619
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