| Title | Implicit Intermittent Fault Detection in Distributed Systems |
| Author | *Peter Waszecki, Matthias Kauer, Martin Lukasiewycz (TUM CREATE, Singapore), Samarjit Chakraborty (TU Munich, Germany) |
| Page | pp. 646 - 651 |
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| Title | A Segmentation-Based BISR Scheme |
| Author | Georgios Zervakis, Nikolaos Eftaxiopoulos, Kostas Tsoumanis, Nicholas Axelos, *Kiamal Pekmestzi (National Technical Univ. of Athens, Greece) |
| Page | pp. 652 - 657 |
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| Title | Fault-Tolerant TSV by Using Scan-Chain Test TSV |
| Author | *Fu-Wei Chen, Hui-Ling Ting, TingTing Hwang (National Tsing Hua Univ., Taiwan) |
| Page | pp. 658 - 663 |
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| Title | Suppressing Test Inflation in Shared-Memory Parallel Automatic Test Pattern Generation |
| Author | Jerry C. Y. Ku, Ryan H.-M. Huang, Louis Y. -Z. Lin, *Charles H.-P. Wen (National Chiao Tung Univ., Taiwan) |
| Page | pp. 664 - 669 |
| Detailed information (abstract, keywords, etc) | |
| Title | A Volume Diagnosis Method for Identifying Systematic Faults in Lower-Yield Wafer Occurring during Mass Production |
| Author | *Tsutomu Ishida, Izumi Nitta (Fujitsu Labs., Japan), Koji Banno (Fujitsu Semiconductor, Japan), Yuzi Kanazawa (Fujitsu Labs., Japan) |
| Page | pp. 670 - 675 |
| Detailed information (abstract, keywords, etc) | |
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