Title | A Retargetable and Accurate Methodology for Logic-IP-Internal Electromigration Assessment |
Author | Palkesh Jain (Qualcomm India Pvt, India), *Sachin S. Sapatnekar (Univ. of Minnesota, U.S.A.), Jordi Cortadella (Univ. Politècnica de Catalunya, Spain) |
Page | pp. 346 - 351 |
Detailed information (abstract, keywords, etc) |
Title | New Electromigration Modeling and Analysis Considering Time-Varying Temperature and Current Densities |
Author | Hai-Bao Chen, *Sheldon X.-D. Tan, Xin Huang (Univ. of California, Riverside, U.S.A.), Valeriy Sukharev (Mentor Graphics, U.S.A.) |
Page | pp. 352 - 357 |
Detailed information (abstract, keywords, etc) |
Title | Generating Circuit Current Constraints to Guarantee Power Grid Safety |
Author | *Zahi Moudallal, Farid N Najm (Univ. of Toronto, Canada) |
Page | pp. 358 - 365 |
Detailed information (abstract, keywords, etc) | |
Slides |
Title | BEE: Predicting Realistic Worst Case and Stochastic Eye Diagrams by Accounting for Correlated Bitstreams and Coding Strategies |
Author | Aadithya Karthik (UC Berkeley, U.S.A.), Sayak Ray (Princeton Univ., U.S.A.), *Jaijeet Roychowdhury (UC Berkeley, U.S.A.) |
Page | pp. 366 - 371 |
Detailed information (abstract, keywords, etc) |
Title | A Fast Parallel Approach for Common Path Pessimism Removal |
Author | *Chung-Hao Tsai, Wai-Kei Mak (National Tsing Hua Univ., Taiwan) |
Page | pp. 372 - 377 |
Detailed information (abstract, keywords, etc) |