| Title | Logic-DRAM Co-Design to Efficiently Repair Stacked DRAM With Unused Spares |
| Author | Minjie Lv, *Hongbin Sun, Jingmin Xin, Nanning Zheng (Xi'an Jiaotong Univ., China) |
| Page | pp. 538 - 543 |
| Detailed information (abstract, keywords, etc) | |
| Title | Electromigration-Aware Redundant via Insertion |
| Author | Jiwoo Pak, Bei Yu, *David Z. Pan (Univ. of Texas, Austin, U.S.A.) |
| Page | pp. 544 - 549 |
| Detailed information (abstract, keywords, etc) | |
| Title | Synthesis of Resilient Circuits from Guarded Atomic Actions |
| Author | Yuankai Chen (Synopsys, U.S.A.), *Hai Zhou (Northwestern Univ., U.S.A.) |
| Page | pp. 550 - 555 |
| Detailed information (abstract, keywords, etc) | |
| Title | Incremental Latin Hypercube Sampling for Lifetime Stochastic Behavioral Modeling of Analog Circuits |
| Author | Yen-Lung Chen (National Central Univ., Taiwan), Wei Wu (Univ. of California, Los Angeles, U.S.A.), *Chien-Nan Jimmy Liu (National Central Univ., Taiwan), Lei He (Univ. of California, Los Angeles, U.S.A.) |
| Page | pp. 556 - 561 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |