Title | On Test Syndrome Merging for Reasoning-Based Board-Level Functional Fault Diagnosis |
Author | Zelong Sun (Chinese Univ. of Hong Kong, Hong Kong), *Li Jiang (Shanghai Jiao Tong Univ., China), Qiang Xu (Chinese Univ. of Hong Kong, Hong Kong), Zhaobo Zhang, Zhiyuan Wang, Xinli Gu (Huawei Technologies, U.S.A.) |
Page | pp. 737 - 742 |
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Title | Event-Driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach |
Author | Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, *Mehdi Tahoori (Karlsruhe Inst. of Tech., Germany) |
Page | pp. 743 - 748 |
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Title | A Novel Methodology for Testing Hardware Security and Trust Exploiting On-Chip Power Noise Measurement |
Author | *Daisuke Fujimoto, Makoto Nagata (Kobe Univ., Japan), Shivam Bhasin, Jean-Luc Danger (Telecom Paristech, France) |
Page | pp. 749 - 754 |
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Title | Hardware Trojan Detection Using Exhaustive Testing of k-bit Subspaces |
Author | Nicole Lesperance, Shrikant Kulkarni, *Kwang-Ting Cheng (UC Santa Barbara, U.S.A.) |
Page | pp. 755 - 760 |
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