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The 21st Asia and South Pacific Design Automation Conference

Session 2B  System Simulation and Testing
Time: 13:50 - 15:30 Tuesday, January 26, 2016
Location: TF4304
Chairs: Liang Shi (Chongqing University, China), Qiang Xu (The Chinese University of Hong Kong, Hong Kong)

2B-1 (Time: 13:50 - 14:15)
TitleNVPsim: A Simulator for Architecture Explorations of Nonvolatile Processors
AuthorYizi Gu, *Yongpan Liu, Yiqun Wang, Hehe Li, Huazhong Yang (Tsinghua University, China)
Pagepp. 147 - 152
Keywordnonvolatile processor, simulator, architecture exploration
AbstractNonvolatile processors (NVPs) preserve run-time information when power failure occurs by utilizing nonvolatile memory technologies. This feature enables NVPs to make forward progress continuously under intermittent power supply in energy harvesting systems. This paper builds a gem5 based NVP simulator named NVPsim, which is validated against measured results of a fabricated prototype with reasonable error rate. Furthermore, to demonstrate the capability of NVPsim for architecture exploration, we evaluated performance and energy consumption of different NVP designs varying in the choice of nonvolatile memory for on-chip caches, the backup strategy and the energy buffer size. Experimental results indicate that nvSRAM outperforms other types of nonvolatile memory as the on-chip cache for energy harvesting systems.

2B-2 (Time: 14:15 - 14:40)
TitleMCSSim: A Memory Channel Storage Simulator
Author*Renhai Chen, Zili Shao (The Hong Kong Polytechnic University, Hong Kong), Chia-Lin Yang (National Taiwan University, Taiwan), Tao Li (University of Florida, U.S.A.)
Pagepp. 153 - 158
KeywordMCSSim, NVDIMMM, Memory Channel Storage
AbstractRecently, NVDIMM (Non-Volatile Dual In-line Memory Module) is being widely supported by leading hardware design companies, such as IBM. Nevertheless, existing efforts largely focus on NVDIMM specification and fabrication issues, and the potential performance gains brought by NVDIMM are not fully investigated. In this paper, we present a NVDIMM based simulator called MCSSim to help study the memory channel storage techniques. MCSSim is a cycle-accurate simulator that is elaborated with the consideration of differences between the memory channel interface and the NAND flash memory features. MCSSim is also implemented with the DRAMSim2 [30] simulator thus enabling the simulation of a variety of hybrid memory systems by combining of DRAM DIMM and NVDIMM. We have done some experiments with MCSSim, and the experimental results show the effectiveness of the proposed simulator.

2B-3 (Time: 14:40 - 15:05)
TitleTrace-Based Context-Sensitive Timing Simulation Considering Execution Path Variations
Author*Sebastian Ottlik, Jan Micha Borrmann, Sadik Asbach, Alexander Viehl (FZI Research Center for Information Technology, Germany), Wolfgang Rosenstiel, Oliver Bringmann (University of Tübingen, Germany)
Pagepp. 159 - 165
KeywordSoftware Timing Simulation, Instruction Set Simulation, Software Performance Analysis
AbstractWe present a fast and accurate timing simulation of binary code execution on complex embedded processors. Underlying block timings are extracted from a preceding hardware execution and differentiated by execution context. Thereby, complex factors, such as caches, can be reflected accurately without explicit modelling. Based on timings observed in one hardware execution, timing of numerous other executions for different inputs can be simulated at an average error below 5% for complex applications on an ARM Cortex-A9 processor.
Slides

2B-4 (Time: 15:05 - 15:30)
TitleGenerating High Coverage Tests for SystemC Designs Using Symbolic Execution
Author*Bin Lin, Zhenkun Yang, Kai Cong, Fei Xie (Portland State University, U.S.A.)
Pagepp. 166 - 171
KeywordSystemC, Test Generation, Symbolic Execution, Coverage
AbstractIn this research, we have developed an approach to generating high coverage tests for SystemC designs using symbolic execution. We have applied this approach to a representative set of SystemC designs. The results show that our approach is able to generate tests that provide high code coverage of the designs with modest time and memory usage and to scale to designs of practical sizes.
Slides