| Wednesday January 25, 2006 |
| Title | Transition-Based Coverage Estimation for Symbolic Model Checking |
| Author | *Xingwen Xu, Shinji Kimura (Waseda Univ., Japan), Kazunari Horikawa, Takehiko Tsuchiya (Toshiba, Japan) |
| Page | pp. 1 - 6 |
| Detailed information (abstract, keywords, etc) | |
| Title | Word Level Functional Coverage Computation |
| Author | *Bijan Alizadeh (Microelectronic Research and Development Center of Iran, Iran) |
| Page | pp. 7 - 12 |
| Detailed information (abstract, keywords, etc) | |
| Title | Discovering the Input Assumptions in Specification Refinement Coverage |
| Author | Prasenjit Basu, Sayantan Das, *Pallab Dasgupta, Partha P Chakrabarti (Indian Inst. of Tech. Kharagpur, India) |
| Page | pp. 13 - 18 |
| Detailed information (abstract, keywords, etc) | |
| Title | Refinement Strategies for Verification Methods Based on Datapath Abstraction |
| Author | *Zaher Semon Andraus, Mark Hammond Liffiton, Karem Ahmad Sakallah (Univ. of Michigan, Ann Arbor, United States) |
| Page | pp. 19 - 24 |
| Detailed information (abstract, keywords, etc) | |
| Title | Generation of Shorter Sequences for High Resolution Error Diagnosis Using Sequential SAT |
| Author | Sung-Jui Pan, *Kwang-Ting Cheng (Univ. of California, Santa Barbara, United States), John Moondanos, Ziyad Hanna (Intel Co., United States) |
| Page | pp. 25 - 29 |
| Detailed information (abstract, keywords, etc) | |