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The 16th Asia and South Pacific Design Automation Conference

Session 3C  Special Session: Post-Silicon Techniques to Counter Process and Electrical Parameter Variability
Time: 16:00 - 18:00 Wednesday, January 26, 2011
Location: Room 414+415
Chair: Jing-Jia Liou (National Tsing Hua Univ., Taiwan)

3C-1 (Time: 16:00 - 16:30)
Title(Invited Paper) Post-silicon Bug Detection for Variation Induced Electrical Bugs
AuthorMing Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng (Univ. of California, Santa Barbara, U.S.A.)
Pagepp. 273 - 278
Detailed information (abstract, keywords, etc)

3C-2 (Time: 16:30 - 17:00)
Title(Invited Paper) Diagnosis-assisted Supply Voltage Configuration to Increase Performance Yield of Cell-Based Designs
AuthorJing-Jia Liou, Ying-Yen Chen, Chun-Chia Chen, Chung-Yen Chien, Kuo-Li Wu (National Tsing Hua Univ., Taiwan)
Pagepp. 279 - 284
Detailed information (abstract, keywords, etc)

3C-3 (Time: 17:00 - 17:30)
Title(Invited Paper) Run-Time Adaptive Performance Compensation using On-chip Sensors
AuthorMasanori Hashimoto (Osaka Univ. & JST, CREST, Japan)
Pagepp. 285 - 290
Detailed information (abstract, keywords, etc)

3C-4 (Time: 17:30 - 18:00)
Title(Invited Paper) The Alarms Project: A Hardware/Software Approach to Addressing Parameter Variations
AuthorDavid Brooks (Harvard Univ., U.S.A.)
Pagep. 291
Detailed information (abstract, keywords, etc)