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The 17th Asia and South Pacific Design Automation Conference

Session 1B  Power Network Design and Analysis
Time: 14:00 - 15:40 Tuesday, January 31, 2012
Location: Room 203
Chairs: Kimiyoshi Usami (Shibaura Institute of Technology, Japan), Saibal Mukhopadhyay (Georgia Institute of Technology, U.S.A.)

1B-1 (Time: 14:00 - 14:25)
TitleIncremental Power Network Analysis Using Backward Random Walks
Author*Baktash Boghrati, Sachin Sapatnekar (University of Minnesota, U.S.A.)
Pagepp. 41 - 46
KeywordRandom walks, Incremental analysis, Power network
AbstractThe process of power network analysis during VLSI chip design is inherently iterative. It is very common for the designer to make many small perturbations to an otherwise complete design, to enhance the design or fix design violations. Considering the size of the modern chips, updating the solution for the changed network can be a computationally intensive task. In this paper we propose an efficient and accurate incremental solver that utilizes the backward random walks to identify the region of influence of the perturbation. The solution of the network is updated for the significantly smaller region only. The proposed algorithm is capable of handling consecutive perturbations without any degradation. The experimental results show speedups of up to 13.7x as compared to a complete solution.

1B-2 (Time: 14:25 - 14:50)
TitleThermal-aware Power Network Design for IR Drop Reduction in 3D ICs
Author*Zuowei Li, Yuchun Ma, Qiang Zhou, Yici Cai, Yu Wang (Tsinghua University, China), Tingting Huang (National Tsing Hua University, China), Yuan Xie (Pennsylvania State University, U.S.A.)
Pagepp. 47 - 52
KeywordP/G TSV plan, P/G network, Thermal, 3D ICs
AbstractDue to the high integration on vertical stacked layers, power/ground network design becomes one of the critical challenges in 3D IC design. With the leakage-thermal dependency, the increasing on-chip temperature in 3D designs has serious impact on IR drop due to the increased wire resistance and increased leakage current. Power/ground (P/G) TSVs can help relieve the IR drop violation by vertically connecting the on-chip P/G networks on different layers. However, most previous works only fulfill a margin of the full potential of PG TSVs planning since they restrict P/G grid in a uniform topology. Besides, their overlook of resistance variation and leakage current will make their results less accurate. In this paper, we present an efficient thermal-aware P/G TSVs planning algorithm based on a sensitivity model with temperature-dependent leakage current considered. The proposed method can overcome the limitation of P/G grid topology and make full use of P/G TSVs planning for optimization of P/G network by allowing short wires to connect the P/G TSVs to P/G grids in non-uniform topology. Moreover, with resistance variation and increased leakage current caused by high temperature in 3D ICs, more accurate result can be obtained. Both the theoretical analysis and experimental results show the efficiency of our approach. Results show that neglecting thermal impacts on power delivery can underestimate IR drop by about 11%. To relieve the severe IR drop violation, 51.8% more P/G TSVs are needed than the cases without thermal impacts considered. Results also show that our P/G TSV planning based on the sensitivity model can reduce max IR drop by 42.3% and reduce the number of violated nodes by 82.4%.

1B-3 (Time: 14:50 - 15:15)
TitleThe Feasibility of Carbon Nanotubes for Power Delivery in 3-D Integrated Circuits
Author*Nauman Khan, Soha Hassoun (Tufts University, U.S.A.)
Pagepp. 53 - 58
Keyword3-D IC, Through Silicon Via, Power Delivery Network Design, CNT
AbstractIncreased power density and package asymmetry pose challenges in designing power delivery networks for 3-D Integrated Circuits (ICs). The increased resistivity of Cu wires due to scaling has shifted attention to alternate interconnect technologies. Continued and significant innovations in CNT manufacturing at CMOS-compatible temperatures with quality low-resistive contacts promise to enable the use of CNT as a replacement. We investigate in this paper the feasibility of using CNTs for power delivery in 3-D ICs. We evaluate the use of CNTs as Through-Silicon Vias (TSVs) and as wiring for global power delivery grids, fabricated on interposer dies. We assume the CNT interconnect has a mix of single- and multi-walled CNTs with 30% metallic nanotubes. We design a 3-D system-level comparative framework that utilizes select traces from SPEC benchmarks to evaluate improvements of CNTs over Cu. Our results emphasize how CNTs can significantly improve power delivery for 3-D integrated circuits. Using CNTs for on-chip power grid and for TSVs reduces the number of TSVs by 71% when compared to a Cu implementation. For the same substrate area dedicated to power-TSVs, CNTs improve the maximum and average IR drop by 98% and 40%, respectively. Improvements in the Ldi/dt drop are 47% and 18%, respectively.

1B-4 (Time: 15:15 - 15:40)
TitleAn Efficient Hamiltonian-Cycle Power-Switch Routing for MTCMOS Designs
Author*Yi-Ming Wang (Dept. of Electronics Engineering, National Chiao Tung University, Taiwan), Shi-Hao Chen (Global Unichip Corp., Taiwan), Mango C.-T. Chao (Dept. of Electronics Engineering, National Chiao Tung University, Taiwan)
Pagepp. 59 - 65
Keywordpower gating, MTCMOS, low power
AbstractMTCMOS is popular in industry for implementing a power gating design. Major IC foundries recommend turning on power switches one by one to reduce the peak current during the mode transition. In this paper, we propose a power-switch-routing framework, which can effectively and efficiently find a feasible Hamiltonian-cycle routing among power switches without violating the Manhattan distance constraint while handling the irregular placement of power switches. The framework is currently used in a design service company.