Title | (Invited Paper) Accurate and Inexpensive Performance Monitoring for Variability-Aware Systems |
Author | Liangzhen Lai, *Puneet Gupta (UCLA, U.S.A.) |
Page | pp. 467 - 473 |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Quantifying Workload Dependent Reliability in Embedded Processors |
Author | *Vikas Chandra (ARM, U.S.A.) |
Page | pp. 474 - 477 |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) QED Post-Silicon Validation and Debug: Frequently Asked Questions |
Author | David Lin, *Subhasish Mitra (Stanford Univ., U.S.A.) |
Page | pp. 478 - 482 |
Detailed information (abstract, keywords, etc) |