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The 20th Asia and South Pacific Design Automation Conference

Session 4S  (Special Session) Machine Learning in EDA: Promises and Challenges in Selected Applications
Time: 10:15 - 12:20 Wednesday, January 21, 2015
Location: Room 103
Chair: Li-C. Wang (Univ. of California, Santa Barbara, U.S.A.)

4S-1 (Time: 10:15 - 10:45)
Title(Invited Paper) Machine Learning and Pattern Matching in Physical Design
AuthorBei Yu, *David Z. Pan (Univ. of Texas, Austin, U.S.A.), Tetsuaki Matsunawa (Toshiba, Japan), Xuan Zeng (Fudan Univ., China)
Pagepp. 286 - 293
Detailed information (abstract, keywords, etc)

4S-2 (Time: 10:45 - 11:15)
Title(Invited Paper) Self-Learning and Adaptive Board-Level Functional Fault Diagnosis
AuthorFangming Ye, *Krishnendu Chakrabarty (Duke Univ., U.S.A.), Zhaobo Zhang, Xinli Gu (Huawei Technologies, U.S.A.)
Pagepp. 294 - 301
Detailed information (abstract, keywords, etc)

4S-3 (Time: 11:15 - 11:45)
Title(Invited Paper) Fast Statistical Analysis of Rare Failure Events for Memory Circuits in High-Dimensional Variation Space
AuthorShupeng Sun, *Xin Li (Carnegie Mellon Univ., U.S.A.)
Pagepp. 302 - 307
Detailed information (abstract, keywords, etc)
Slides

4S-4 (Time: 11:45 - 12:20)
Title(Invited Paper) Data Mining in Functional Test Content Optimization
Author*Li-C. Wang (Univ. of California, Santa Barbara, U.S.A.)
Pagepp. 308 - 315
Detailed information (abstract, keywords, etc)