| Title | On Test Syndrome Merging for Reasoning-Based Board-Level Functional Fault Diagnosis |
| Author | Zelong Sun (Chinese Univ. of Hong Kong, Hong Kong), *Li Jiang (Shanghai Jiao Tong Univ., China), Qiang Xu (Chinese Univ. of Hong Kong, Hong Kong), Zhaobo Zhang, Zhiyuan Wang, Xinli Gu (Huawei Technologies, U.S.A.) |
| Page | pp. 737 - 742 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Event-Driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach |
| Author | Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, *Mehdi Tahoori (Karlsruhe Inst. of Tech., Germany) |
| Page | pp. 743 - 748 |
| Detailed information (abstract, keywords, etc) | |
| Title | A Novel Methodology for Testing Hardware Security and Trust Exploiting On-Chip Power Noise Measurement |
| Author | *Daisuke Fujimoto, Makoto Nagata (Kobe Univ., Japan), Shivam Bhasin, Jean-Luc Danger (Telecom Paristech, France) |
| Page | pp. 749 - 754 |
| Detailed information (abstract, keywords, etc) | |
| Title | Hardware Trojan Detection Using Exhaustive Testing of k-bit Subspaces |
| Author | Nicole Lesperance, Shrikant Kulkarni, *Kwang-Ting Cheng (UC Santa Barbara, U.S.A.) |
| Page | pp. 755 - 760 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |