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The 15th Asia and South Pacific Design Automation Conference

Session 3D  Special Session: Recent Advancement in Post-silicon Validation
Time: 8:30 - 10:10 Wednesday, January 20, 2010
Location: Room 101D
Chair: Ing-Jer Huang (National Sun Yat-Sen Univ., Taiwan)

3D-1 (Time: 8:30 - 8:55)
Title(Invited Paper) Data Learning Based Diagnosis
Author*Li-C. Wang (Univ. of California, Santa Barbara, U.S.A.)
Pagepp. 247 - 254
Detailed information (abstract, keywords, etc)
Slides

3D-2 (Time: 8:55 - 9:20)
Title(Invited Paper) Using Introspective Software-based Testing for Post-silicon Debug and Repair
AuthorTodd Austin (Univ. of Michigan, U.S.A.)
Detailed information (abstract, keywords, etc)

3D-3 (Time: 9:20 - 9:45)
Title(Invited Paper) Post-silicon Debugging for Multi-core Designs
Author*Valeria Bertacco (Univ. of Michigan, U.S.A.)
Pagepp. 255 - 258
Detailed information (abstract, keywords, etc)

3D-4 (Time: 9:45 - 9:57)
Title(Invited Paper) Low-cost Design for Repair with Circuit Partitioning
AuthorKyungho Kim, Byungtae Kang, Dongyun Kim (Samsung Electronics Co., Republic of Korea), Sungchul Lee, Juyong Shin, *Hyunchul Shin (Hanyang Univ., Republic of Korea)
Pagepp. 259 - 261
Detailed information (abstract, keywords, etc)

3D-5 (Time: 9:57 - 10:09)
Title(Invited Paper) On Signal Tracing in Post-silicon Validation
Author*Qiang Xu, Xiao Liu (Chinese Univ. of Hong Kong, Hong Kong)
Pagepp. 262 - 267
Detailed information (abstract, keywords, etc)