Title | (Invited Paper) Data Learning Based Diagnosis |
Author | *Li-C. Wang (Univ. of California, Santa Barbara, U.S.A.) |
Page | pp. 247 - 254 |
Detailed information (abstract, keywords, etc) | |
Slides |
Title | (Invited Paper) Using Introspective Software-based Testing for Post-silicon Debug and Repair |
Author | Todd Austin (Univ. of Michigan, U.S.A.) |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Post-silicon Debugging for Multi-core Designs |
Author | *Valeria Bertacco (Univ. of Michigan, U.S.A.) |
Page | pp. 255 - 258 |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) Low-cost Design for Repair with Circuit Partitioning |
Author | Kyungho Kim, Byungtae Kang, Dongyun Kim (Samsung Electronics Co., Republic of Korea), Sungchul Lee, Juyong Shin, *Hyunchul Shin (Hanyang Univ., Republic of Korea) |
Page | pp. 259 - 261 |
Detailed information (abstract, keywords, etc) |
Title | (Invited Paper) On Signal Tracing in Post-silicon Validation |
Author | *Qiang Xu, Xiao Liu (Chinese Univ. of Hong Kong, Hong Kong) |
Page | pp. 262 - 267 |
Detailed information (abstract, keywords, etc) |