| Title | Laplacian Eigenmaps and Bayesian Clustering Based Layout Pattern Sampling and Its Applications to Hotspot Detection and OPC |
| Author | *Tetsuaki Matsunawa (Toshiba, Japan), Bei Yu (Chinese Univ. of Hong Kong, Hong Kong), David Z. Pan (Univ. of Texas, Austin, U.S.A.) |
| Page | pp. 679 - 684 |
| Detailed information (abstract, keywords, etc) | |
| Title | Balancing Lifetime and Soft-Error Reliability to Improve System Availability |
| Author | *Junlong Zhou (Univ. of Notre Dame, East China Normal Univ., U.S.A.), X. Sharon Hu, Yue Ma (Univ. of Notre Dame, U.S.A.), Tongquan Wei (East China Normal Univ., China) |
| Page | pp. 685 - 690 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | A Closed-Form Stability Model for Cross-Coupled Inverters Operating in Sub-Threshold Voltage Region |
| Author | *Tatsuya Kamakari, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera (Kyoto Univ., Japan) |
| Page | pp. 691 - 696 |
| Detailed information (abstract, keywords, etc) | |
| Title | Delay Uncertainty and Signal Criticality Driven Routing Channel Optimization for Advanced DRAM Products |
| Author | Samyoung Bang (Samsung Electronics, Republic of Korea), Kwangsoo Han, Andrew B. Kahng, *Mulong Luo (Univ. of California, San Diego, U.S.A.) |
| Page | pp. 697 - 704 |
| Detailed information (abstract, keywords, etc) | |