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The 16th Asia and South Pacific Design Automation Conference

Session 7C  Physical Design for Yield
Time: 10:20 - 12:20 Friday, January 28, 2011
Location: Room 414+415
Chair: Cliff Sze (IBM, U.S.A.)

7C-1 (Time: 10:20 - 10:50)
TitleRobust Clock Tree Synthesis with Timing Yield Optimization for 3D-ICs
Author*Jae-Seok Yang, Jiwoo Pak (University of Texas at Austin, U.S.A.), Xin Zhao, Sung Kyu Lim (Georgia Institute of Technology, U.S.A.), David Z. Pan (University of Texas at Austin, U.S.A.)
Pagepp. 621 - 626
KeywordTSV, CTS, stress, timing optimization, 3D IC
Abstract3D integration has new manufacturing and design challenges such as timing corner mismatch between tiers and device variation due to Through Silicon Via (TSV) induced stress. Timing corner mismatch between tiers is caused because each tier is manufactured in independent process. Therefore, inter-die variation should be considered to analyze and optimize for paths spreading over several tiers. TSV induced stress is another challenge in 3D Clock Tree Synthesis (CTS). Mobility variation of a clock buffer due to stress from TSV can cause unexpected skew which degrades overall chip performance. In this paper, we propose clock tree design methodology with the following objectives: (a) to minimize clock period variation by assigning optimal z-location of clock buffers with an Integer Linear Program (ILP) formulation, (b) to prevent unwanted skew induced by the stress. In the results, we show that our clock buffer tier assignment reduces clock period variation up to 34.2%, and the most of stress-induced skew can be removed by our stress-aware CTS. Overall, we show that performance gain can be up to 5.7% with our robust 3D CTS.

7C-2 (Time: 10:50 - 11:20)
TitleTrack Routing Optimizing Timing and Yield
AuthorXin Gao, *Luca Macchiarulo (Department of Electrical Engineering, University of Hawaii at Manoa, U.S.A.)
Pagepp. 627 - 632
KeywordTrack routing, timing, yield, Geometric Programming
AbstractIn this paper, we propose a track routing algorithm for timing and yield optimization. The algorithm solves the problem in two stages: wire ordering, and wire spacing and sizing. The wire ordering problem is solved by an algorithm based on wire merging. For the wire spacing and sizing problem, we show that it can be represented as a Mixed Linear Geometric Programming (MLGP) problem which can be transformed into a convex optimization problem. Since general nonlinear convex optimization may take a long running time, we propose a heuristic that solves the problem much faster. Experimental results show that, compared to the algorithm that only optimizes yield, our algorithm is able to improve the minimum timing slack by 20%.

7C-3 (Time: 11:20 - 11:50)
TitleSimultaneous Redundant Via Insertion and Line End Extension for Yield Optimization
AuthorShing-Tung Lin (National Tsing Hua University, Taiwan), Kuang-Yao Lee (Taiwan Semiconductor Manufacturing Company, Taiwan), *Ting-Chi Wang (National Tsing Hua University, Taiwan), Cheng-Kok Koh (Purdue University, U.S.A.), Kai-Yuan Chao (Intel Corporation, U.S.A.)
Pagepp. 633 - 638
Keywordinteger linear program (ILP), redundant via insertion, line end extension, yield
AbstractIn this paper, we formulate a problem of simultaneous redundant via insertion and line end extension for via yield optimization. Our problem is more general than previous works in the sense that more than one type of line end extension is considered and the objective function to be optimized directly accounts for via yield. We present a zero-one integer linear program based approach, that is equipped with two speedup techniques, to solve the addressed problem optimally. In addition, we describe how to modify our approach to exactly solve a previous work. Extensive experimental results are shown to demonstrate the effectiveness and efficiency of our approaches.
Slides

7C-4 (Time: 11:50 - 12:20)
TitlePruning-based Trace Signal Selection Algorithm
Author*Kang Zhao, Jinian Bian (Tsinghua University, China)
Pagepp. 639 - 644
KeywordAlgorithm, silicon debug, state restoration, trace signal selection
AbstractTo improve the observability in the post-silicon validation, how to select the limited trace signals effectively for the data acquisition is the focus. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. The experiments indicate that the proposed algorithm can bring higher restoration ratios, and it is more effective compared to existing methods.
Slides