| Title | Fast False Path Identification Based on Functional Unsensitizability Using RTL Information |
| Author | *Yuki Yoshikawa (Hiroshima City Univ., Japan), Satoshi Ohtake (NAIST, Japan), Tomoo Inoue (Hiroshima City Univ., Japan), Hideo Fujiwara (NAIST, Japan) |
| Page | pp. 660 - 665 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power |
| Author | *Zhen Chen, Boxue Yin, Dong Xiang (Tsinghua Univ., China) |
| Page | pp. 666 - 671 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Dynamic Test Compaction for a Random Test Generation Procedure with Input Cube Avoidance |
| Author | Irith Pomeranz (Purdue Univ., United States), *Sudhakar Reddy (Univ. of Iowa, United States) |
| Page | pp. 672 - 677 |
| Detailed information (abstract, keywords, etc) | |
| Title | Detectability of Internal Bridging Faults in Scan Chains |
| Author | *Fan Yang (Univ. of Iowa, United States), Sreejit Chakravarty, Narendra Devta-Prasanna (LSI Corp., United States), Sudhakar M. Reddy (Univ. of Iowa, United States), Irith Pomeranz (Purdue Univ., United States) |
| Page | pp. 678 - 683 |
| Detailed information (abstract, keywords, etc) | |
| Title | Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs |
| Author | *Bing-Chuan Bai (National Taiwan Univ., Taiwan), Augusli Kifli (Faraday Technology Corp., Taiwan), Chien-Mo Li (National Taiwan Univ., Taiwan), Kun-Cheng Wu (Faraday Technology Corp., Taiwan) |
| Page | pp. 684 - 689 |
| Detailed information (abstract, keywords, etc) | |