Title | Analyzing Electrical Effects of RTA-driven Local Anneal Temperature Variation |
Author | *Vivek Joshi (Univ. of Michigan, U.S.A.), Kanak Agarwal (IBM, U.S.A.), Dennis Sylvester, David Blaauw (Univ. of Michigan, U.S.A.) |
Page | pp. 739 - 744 |
Detailed information (abstract, keywords, etc) | |
Slides |
Title | Physical Design Techniques for Optimizing RTA-induced Variations |
Author | Yaoguang Wei (Univ. of Minnesota, U.S.A.), Jiang Hu (Texas A&M Univ., U.S.A.), Frank Liu (IBM, U.S.A.), *Sachin Sapatnekar (Univ. of Minnesota, U.S.A.) |
Page | pp. 745 - 750 |
Detailed information (abstract, keywords, etc) | |
Slides |
Title | On Confidence in Characterization and Application of Variation Models |
Author | Lerong Cheng, Puneet Gupta, *Lei He (UCLA, U.S.A.) |
Page | pp. 751 - 756 |
Detailed information (abstract, keywords, etc) |