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The 19th Asia and South Pacific Design Automation Conference

Session 1C  Circuit, Architecture, and System for Emerging Technologies
Time: 10:40 - 12:20 Tuesday, January 21, 2014
Location: Room 303
Chairs: Hai (Helen) Li (University of Pittsburgh, U.S.A.), Danghui Wang (Northwestern Polytechnical University, China)

1C-1 (Time: 10:40 - 11:05)
TitlePrefetching Techniques for STT-RAM Based Last-Level Cache in CMP Systems
AuthorMengjie Mao (University of Pittsburgh, U.S.A.), Guangyu Sun (Peking University, China), Yong Li, Alex K. Jones, *Yiran Chen (University of Pittsburgh, U.S.A.)
Pagepp. 67 - 72
Keywordprefetch, STT-RAM, last-level cache
AbstractPrefetching is widely used in modern computer systems to mitigate the impact of long memory access latency by paying extra cost in memory and cache accesses. However, the efficacy of prefetching significantly degrades in the memory hierarchy using the emerging spin-transfer torque random access memory (STT-RAM) as last-level cache (LLC) due to the long write access latency. In this work, we propose two orthogonal but complimentary techniques to improve the prefetching efficacy of STT-RAM based LLC in chip multi-processor systems, namely, request prioritization (RP) and hybrid local-global prefetch control (HLGPC). Simulation results show that by combining these two techniques, we can achieve 6.5%~11% system performance improvement and 4.8%~7.3% LLC energy reduction in a quadcore system with 2MB~8MB STT-RAM based LLC, compared to baseline with basic prefetching.
Slides

1C-2 (Time: 11:05 - 11:30)
TitleCNPUF: A Carbon Nanotube-based Physically Unclonable Function for Secure Low-Energy Hardware Design
Author*Sven Tenzing Choden Konigsmark, Leslie K. Hwang, Deming Chen, Martin D. F. Wong (University of Illinois at Urbana-Champaign, U.S.A.)
Pagepp. 73 - 78
KeywordPUF, CNT, Low power, Security, Emerging Technology
AbstractPhysically Unclonable Functions (PUFs) are used to provide identification, authentication and secret key generation based on unique and unpredictable physical characteristics. Carbon Nanotube Field Effect Transistors (CNFETs) were shown to have excellent electrical and unique physical characteristics and are promising candidates to replace silicon transistors in future Very Large Scale Integration (VLSI) designs. We present Carbon Nanotube PUF (CNPUF), the first PUF design that takes advantage of unique CNFET characteristics. We achieve higher reliability against environmental variations and increased resistance against modeling attacks. Furthermore, we have a considerable power and energy reduction in comparison to previous ultra-low power PUF designs of 89.6% and 98%, respectively. Additionally, CNPUF allows power-security tradeoff.
Slides

1C-3 (Time: 11:30 - 11:55)
Title3DCoB: A New Design Approach for Monolithic 3D Integrated Circuits
Author*Hossam Sarhan, Sebastien Thuries, Olivier Billoint, Fabien Clermidy (CEA-LETI, France)
Pagepp. 79 - 84
Keyword3D-IC, Monolithic, Sequential Integration, cell-on-cell, cell-on-buffer
Abstract3D Monolithic Integration (3DMI) technology provides very high dense vertical interconnects with low parasitics. Previous 3DMI design approaches provide either cell-on-cell or transistor-on-transistor integration. In this paper we present 3D Cell-on-Buffer (3DCoB) as a novel design approach for 3DMI. Our approach provides a fully compatible sign-off physical implementation flow with the conventional 2D tools. We implement our approach on some benchmark circuits using 28nm-FDSOI technology. The sign-off performance results show 35% improvement compared to the same 2D design.
Slides

1C-4 (Time: 11:55 - 12:20)
TitleEmulator-Oriented Tiny Processors for Unreliable Post-Silicon Devices: A Case Study
Author*Yuko Hara-Azumi (Nara Institute of Science and Technology/JST, PRESTO, Japan), Masaya Kunimoto, Yasuhiko Nakashima (Nara Institute of Science and Technology, Japan)
Pagepp. 85 - 90
KeywordEmulator-oriented processor, Reliability, Post-silicon
AbstractAlthough various post-silicon devices have been invested in recent years, they still have a major issue of reliability. Because circuit area is an essential factor of reliability, especially for such unreliable post-silicon devices, it is desired to build small circuits which can reuse as many today's application programs as possible even if the performance is not very high. This paper presents the very first work to study novel, efficient techniques of emulating wider-bit guest processors (e.g., 32-bit) on a narrower-bit host processor (e.g., 8-bit) with the very limited hardware resources while mitigating performance degradation. We propose three types of tiny emulation-oriented processors varying in available hardware resources and reliability enhancement approaches. Quantitative evaluation and discussions are done for comparing those three processors. We believe that this work will lead not only acceleration of developing post-silicon technology but also a big paradigm shift in building digital devices.