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The 16th Asia and South Pacific Design Automation Conference

Session 7B  NBTI and Power Gating
Time: 10:20 - 12:20 Friday, January 28, 2011
Location: Room 413
Chairs: Kimiyoshi Usami (Shibaura Inst. of Tech., Japan), Toshio Sudo (Shibaura Inst. of Tech., Japan)

7B-1 (Time: 10:20 - 10:50)
TitleControlling NBTI Degradation during Static Burn-in Testing
Author*Ashutosh Chakraborty, David Z. Pan (Univ. of Texas, Austin, U.S.A.)
Pagepp. 597 - 602
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7B-2 (Time: 10:50 - 11:20)
TitleA Fine-Grained Technique of NBTI-Aware Voltage Scaling and Body Biasing for Standard Cell Based Designs
Author*Yongho Lee (Samsung Electronics, Republic of Korea), Taewhan Kim (Seoul National Univ., Republic of Korea)
Pagepp. 603 - 608
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7B-3 (Time: 11:20 - 11:50)
TitleNBTI-Aware Power Gating Design
AuthorMing-Chao Lee, *Yu-Guang Chen, Ding-Kai Huang, Shih-Chieh Chang (National Tsing Hua Univ., Taiwan)
Pagepp. 609 - 614
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Slides

7B-4 (Time: 11:50 - 12:20)
TitleRobust Power Gating Reactivation By Dynamic Wakeup Sequence Throttling
AuthorTung-Yeh Wu, Shih-Hsin Hu, *Jacob A. Abraham (Univ. of Texas, Austin, U.S.A.)
Pagepp. 615 - 620
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