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The 19th Asia and South Pacific Design Automation Conference

Session 5B  Reliability Analysis and Enhencement
Time: 13:50 - 15:30 Wednesday, January 22, 2014
Location: Room 301
Chair: Shigeki Nojima (Toshiba, Japan)

5B-1 (Time: 13:50 - 14:15)
TitleRedundant-Via-Aware ECO Routing
Author*Hsi-An Chien, Ting-Chi Wang (National Tsing Hua Univ., Taiwan)
Pagepp. 418 - 423
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5B-2 (Time: 14:15 - 14:40)
TitleA Fast and Provably Bounded Failure Analysis of Memory Circuits in High Dimensions
AuthorWei Wu, Fang Gong (Univ. of California, Los Angeles, U.S.A.), Gengsheng Chen (Fudan Univ., China), *Lei He (Univ. of California, Los Angeles, U.S.A.)
Pagepp. 424 - 429
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5B-3 (Time: 14:40 - 15:05)
TitlePredicting Circuit Aging Using Ring Oscillators
AuthorDeepashree Sengupta, *Sachin Sapatnekar (Univ. of Minnesota, U.S.A.)
Pagepp. 430 - 435
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5B-4 (Time: 15:05 - 15:30)
TitleStatistical Analysis of Process Variation Based on Indirect Measurements for Electronic System Design
Author*Ivan Ukhov, Mattias Villani, Petru Eles, Zebo Peng (Linköping Univ., Sweden)
Pagepp. 436 - 442
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