(Back to Session Schedule)

The 15th Asia and South Pacific Design Automation Conference

Session 6B  Timing-related Testing and Diagnosis
Time: 15:30 - 17:10 Wednesday, January 20, 2010
Location: Room 101B
Chairs: Shi-Yu Huang (National Tsing Hua Univ., Taiwan), Hideo Fujiwara (NAIST, Japan)

6B-1 (Time: 15:30 - 15:55)
TitleImproved Weight Assignment for Logic Switching Activity During At-Speed Test Pattern Generation
Author*Meng-Fan Wu, Hsin-Chieh Pan, Teng-Han Wang, Jiun-Lang Huang (National Taiwan Univ., Taiwan), Kun-Han Tsai, Wu-Tung Cheng (Mentor Graphics Corp., U.S.A.)
Pagepp. 493 - 498
Detailed information (abstract, keywords, etc)
Slides

6B-2 (Time: 15:55 - 16:20)
TitleGraph Partition based Path Selection for Testing of Small Delay Defects
AuthorZijian He, *Tao Lv, Huawei Li, Xiaowei Li (Institute of Computing Technology, CAS, China)
Pagepp. 499 - 504
Detailed information (abstract, keywords, etc)
Slides

6B-3 (Time: 16:20 - 16:45)
TitleFunctional and Partially-Functional Skewed-Load Tests
AuthorIrith Pomeranz (Purdue Univ., U.S.A.), *Sudhakar M. Reddy (Univ. of Iowa, U.S.A.)
Pagepp. 505 - 510
Detailed information (abstract, keywords, etc)
Slides

6B-4 (Time: 16:45 - 17:10)
TitleEmulating and Diagnosing IR-Drop by Using Dynamic SDF
AuthorKe Peng (Univ. of Connecticut, U.S.A.), Yu Huang, Ruifeng Guo, *Wu-Tung Cheng (Mentor Graphics, U.S.A.), Mohammad Tehranipoor (Univ. of Connecticut, U.S.A.)
Pagepp. 511 - 516
Detailed information (abstract, keywords, etc)
Slides