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Call for PapersAreas of Interest
	| Original papers on, but not limited to, the following areas are invited. |  
	| [1] | System Level Design: |  
	|  | System VLSI and SOC design methods, System specification, Specification languages, Design languages, Hardware-software co-design, Co-simulation, Co-verification, Platform-based design, Design reuse and IP’s |  
	| [2] | Embedded and Real-Time Systems: |  
	|  | Low power system design, Network on chip, Communication architecture, Memory architecture, Real-time OS and middleware, Compilation techniques, ASIP synthesis |  
	| [3] | Behavioral/Logic Synthesis and Optimization: |  
	|  | Behavioral/RTL synthesis, Technology-independent optimization, Technology mapping, Interaction between logic design and layout, Sequential and asynchronous logic synthesis |  
	| [4] | Validation and Verification for Behavioral/Logic Design: |  
	|  | Logic simulation, Symbolic simulation, Formal verification, Equivalence checking, Transaction-level/RTL and gate-level modeling and validation |  
	| [5] | Physical Design (Routing): |  
	|  | Routing, Repeater issues, Interconnect optimization, Interconnect planning, Module generation, Layout verification |  
	| [6] | Physical Design (Placement): |  
	|  | Placement, Floorplanning, Partitioning, Hierarchical design |  
	| [7] | Timing, Power, Signal/Power Integrity Analysis and Optimization: |  
	|  | Timing analysis, Power analysis, Signal/power integrity, Clock and global signal design |  
	| [8] | Interconnect, Device and Circuit Modeling and Simulation: |  
	|  | Interconnect modeling, Interconnect extraction, Package modeling, Circuit simulation, Device modeling/simulation, Library design, Design fabrics, Design for manufacturability, Yield optimization, Reliability analysis, Emerging technologies |  
	| [9] | Test and Design for Testability: |  
	|  | Test design, Fault modeling, ATPG, BIST and DFT, Memory, core and system test |  
	| [10] | Analog, RF and Mixed Signal Design and CAD: |  
	|  | Analog/RF synthesis, Analog layout, Verification, Simulation techniques, Noise analysis, Analog circuit testing, Mixed-signal design considerations |  
	| [11] | Leading Edge Design Methodologies: |  
	|  | Novel design methodologies for SOCs, SIPs, IP-cores, processors, memories, A/D mixed circuits, Sensors, MEMS chips, FPGAs, reconfigurable systems, etc. and design examples based on the aforementioned methodologies |  Last Updated on: March 29, 2007 |    |