| Title | Robust Spatial Correlation Extraction with Limited Sample via L1-Norm Penalty |
| Author | Mingzhi Gao, *Zuochang Ye, Dajie Zeng, Yan Wang, Zhiping Yu (Tsinghua Univ., China) |
| Page | pp. 677 - 682 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Device-Parameter Estimation with On-chip Variation Sensors Considering Random Variability |
| Author | *Ken-ichi Shinkai, Masanori Hashimoto (Osaka Univ., Japan) |
| Page | pp. 683 - 688 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | Accounting for Inherent Circuit Resilience and Process Variations in Analyzing Gate Oxide Reliability |
| Author | Jianxin Fang, *Sachin S. Sapatnekar (Univ. of Minnesota, U.S.A.) |
| Page | pp. 689 - 694 |
| Detailed information (abstract, keywords, etc) | |
| Title | Variation-Tolerant and Self-Repair Design Methodology for Low Temperature Polycrystalline Silicon Liquid Crystal and Organic Light Emitting Diode Displays |
| Author | *Chih-Hsiang Ho, Chao Lu, Debabrata Mohapatra, Kaushik Roy (Purdue Univ., U.S.A.) |
| Page | pp. 695 - 700 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |