Title | Robust Spatial Correlation Extraction with Limited Sample via L1-Norm Penalty |
Author | Mingzhi Gao, *Zuochang Ye, Dajie Zeng, Yan Wang, Zhiping Yu (Tsinghua Univ., China) |
Page | pp. 677 - 682 |
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Title | Device-Parameter Estimation with On-chip Variation Sensors Considering Random Variability |
Author | *Ken-ichi Shinkai, Masanori Hashimoto (Osaka Univ., Japan) |
Page | pp. 683 - 688 |
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Title | Accounting for Inherent Circuit Resilience and Process Variations in Analyzing Gate Oxide Reliability |
Author | Jianxin Fang, *Sachin S. Sapatnekar (Univ. of Minnesota, U.S.A.) |
Page | pp. 689 - 694 |
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Title | Variation-Tolerant and Self-Repair Design Methodology for Low Temperature Polycrystalline Silicon Liquid Crystal and Organic Light Emitting Diode Displays |
Author | *Chih-Hsiang Ho, Chao Lu, Debabrata Mohapatra, Kaushik Roy (Purdue Univ., U.S.A.) |
Page | pp. 695 - 700 |
Detailed information (abstract, keywords, etc) | |
Slides |