(Back to Session Schedule)

The 16th Asia and South Pacific Design Automation Conference

Session 8B  Test for Reliability and Yield
Time: 13:40 - 15:40 Friday, January 28, 2011
Location: Room 413
Chairs: Yu Huang (Mentor Graphics, U.S.A.), Yoshinobu Higami (Ehime Univ., Japan)

8B-1 (Time: 13:40 - 14:10)
TitleA Physical-Location-Aware Fault Redistribution for Maximum IR-Drop Reduction
Author*Fu-Wei Chen, Shih-Liang Chen, Yung-Sheng Lin, TingTing Hwang (National Tsing Hua Univ., Taiwan)
Pagepp. 701 - 706
Detailed information (abstract, keywords, etc)

8B-2 (Time: 14:10 - 14:40)
TitleOn the Impact of Gate Oxide Degradation on SRAM Dynamic and Static Write-ability
Author*Vikas Chandra, Robert Aitken (ARM, U.S.A.)
Pagepp. 707 - 712
Detailed information (abstract, keywords, etc)

8B-3 (Time: 14:40 - 15:10)
TitleA Self-Testing and Calibration Method for Embedded Successive Approximation Register ADC
AuthorXuan-Lun Huang, Ping-Ying Kang (National Taiwan Univ., Taiwan), Hsiu-Ming Chang (Univ. of California, Santa Barbara, U.S.A.), *Jiun-Lang Huang (National Taiwan Univ., Taiwan), Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai, Cheng-Wen Wu (ITRI, Taiwan)
Pagepp. 713 - 718
Detailed information (abstract, keywords, etc)

8B-4 (Time: 15:10 - 15:40)
TitleOn-chip Dynamic Signal Sequence Slicing for Efficient Post-Silicon Debugging
Author*Yeonbok Lee, Takeshi Matsumoto, Masahiro Fujita (Univ. of Tokyo, Japan)
Pagepp. 719 - 724
Detailed information (abstract, keywords, etc)