| Title | A Physical-Location-Aware Fault Redistribution for Maximum IR-Drop Reduction |
| Author | *Fu-Wei Chen, Shih-Liang Chen, Yung-Sheng Lin, TingTing Hwang (National Tsing Hua Univ., Taiwan) |
| Page | pp. 701 - 706 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | On the Impact of Gate Oxide Degradation on SRAM Dynamic and Static Write-ability |
| Author | *Vikas Chandra, Robert Aitken (ARM, U.S.A.) |
| Page | pp. 707 - 712 |
| Detailed information (abstract, keywords, etc) | |
| Title | A Self-Testing and Calibration Method for Embedded Successive Approximation Register ADC |
| Author | Xuan-Lun Huang, Ping-Ying Kang (National Taiwan Univ., Taiwan), Hsiu-Ming Chang (Univ. of California, Santa Barbara, U.S.A.), *Jiun-Lang Huang (National Taiwan Univ., Taiwan), Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai, Cheng-Wen Wu (ITRI, Taiwan) |
| Page | pp. 713 - 718 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |
| Title | On-chip Dynamic Signal Sequence Slicing for Efficient Post-Silicon Debugging |
| Author | *Yeonbok Lee, Takeshi Matsumoto, Masahiro Fujita (Univ. of Tokyo, Japan) |
| Page | pp. 719 - 724 |
| Detailed information (abstract, keywords, etc) | |
| Slides | |